Method and system of monitoring and controlling deformation of a wafer substrate

ABSTRACT

A method and system are for monitoring and controlling deformation of a wafer substrate during a plasma etching of the wafer substrate. The method includes disposing a wafer substrate on a platen assembly within a process chamber so that an entire upper surface of the wafer is exposed, passing a process gas into the process chamber, applying a radio frequency bias voltage to the platen assembly, generating a plasma within the process chamber, monitoring a voltage difference between the platen assembly and the process chamber, during the etch process, and attenuating or extinguishing the plasma to prevent further etching once a threshold monitored voltage is reached.

BACKGROUND

The present invention relates to a method and system of monitoring andcontrolling deflection of a wafer during a plasma etching process.

When processing wafer substrates for use in electronic andoptoelectronic applications there is a need to ensure the wafer surfacesare very smooth and clean. Once the bulk wafer has been prepared variousgrinding, polishing and etching steps are required to produce smoothuniform surfaces. However, it is found that there can be a build up ofstress near the surface of the wafer, largely as a consequence of themechanical abrasion steps. A stress imbalance between a front and rearof the wafer can result in wafer bow, which in turn, can have adverseconsequences for future process steps. To minimise the stress imbalance,various methods can be employed, such as wet chemical etching, chemicalmechanical polishing or plasma etching, or a combination of theseprocesses.

When using plasma etching to relieve stress or to produce a surfacetexture on a wafer substrate the key requirements are the uniformremoval of material from the surface, without producing wafer damage, atas high a rate as possible. Inherent in this plasma etch process is achange in stress in the wafer that can result in wafer deformation.Excessive deformation can result in wafer breakage which is veryundesirable, since the etch chamber must then typically be vented toremove the debris. This is turn results in costly downtime for theplasma etch tool.

In conventional plasma etching, the substrate is retained in positionusing mechanical or electrostatic clamps, and cooled through the use ofa coolant, such as helium, for example. However, when the entire surfaceof the wafer needs to be etched, mechanical clamping cannot be used asthe areas of the wafer where the clamp makes wafer contact, and thuscovers the wafer, will receive a different etch rate to the exposed oruncovered areas of the wafer. Furthermore, when the substrate is aninsulator such as sapphire or glass for example, an electrostatic clampor chuck cannot be used.

SUMMARY

We have now devised a method and system of monitoring deformation of awafer substrate during a plasma etching process.

According to a first aspect of the present invention there is provided amethod of monitoring and controlling deformation of a wafer substrateduring a plasma etching of the wafer substrate, the method comprising:

-   -   disposing a wafer substrate on a platen assembly within a        process chamber so that an entire upper surface of the wafer is        exposed;    -   passing process gas into the process chamber;    -   applying a radio frequency bias voltage to the platen assembly;    -   generating a plasma within the process chamber;    -   monitoring a voltage difference between the platen assembly and        the process chamber, during the plasma etch process;    -   attenuating or extinguishing the plasma to prevent further        etching, once a threshold monitored voltage is reached

In an embodiment, deformation of the wafer substrate, such as warpingand bowing, is monitored relative to the platen assembly, and an amountof relative deformation is determined by monitoring the voltagedifference between the platen assembly and the chamber, during theplasma etch process.

In an embodiment, the method comprises generating a plasma byinductively or capacitively coupling radio frequency (RF) power into theprocess chamber.

In an embodiment, the method comprises inductively coupling RF powerinto the chamber by applying an RF potential to one or more antenna orcoils disposed around the chamber. Alternatively, or in additionthereto, the method comprises capacitively coupling an RF potential tothe platen assembly to produce a plasma in the chamber.

The method comprises monitoring a peak-to-peak voltage difference (Vpp)between the platen assembly and the chamber. In a further embodiment,the method comprises or further comprises monitoring a direct currentvoltage difference (Vdc) between the platen assembly and the chamber.

In an embodiment in which the wafer comprises an initially flatconfiguration, the method comprises attenuating or extinguishing theplasma, once the peak-to-peak voltage difference between the platenassembly and the chamber exceeds 10%, and preferably 20%, of apeak-to-peak voltage difference at the start of the etching process.Alternatively, or in addition thereto, the method may compriseattenuating or extinguishing the plasma once the direct current voltagedifference between the platen assembly and the chamber exceeds 50%, andmore preferably 100%, of a direct current voltage difference at thestart of the etching process. In either situation, the method isarranged to prevent further etching in order to prevent excessivewarping and bowing of the wafer during the etch process, which can leadto a breaking or fracture of the wafer substrate.

In an embodiment in which the wafer comprises an initially deformed orwarped configuration, the method comprises attenuating or extinguishingthe plasma once the monitored peak-to-peak voltage difference or directcurrent voltage difference reduces to a value which is characteristic ofa peak-to-peak voltage difference or direct current voltage differencerespectively, of a wafer which extends in a substantially flatorientation upon the platen assembly. This method step is arranged toprevent further etching of an initially warped wafer, where the initialwarping is primarily caused by the presence of an undesirable layer onthe wafer. As the layer is removed during the etch process then thewafer will relax to a preferred flattened state upon the platenassembly. The method thus provides an indication of the configuration ofthe wafer so that the etching process can be terminated at theappropriate time.

In an embodiment, the method further comprises controlling a temperatureof the platen assembly, to aid regulating the temperature of the wafersubstrate.

In an embodiment, the method further comprises applying a radiofrequency (RF) potential to the platen assembly, to provide a biasvoltage on the platen assembly.

According to a second aspect of the present invention there is provideda system for monitoring deformation of a wafer substrate during a plasmaetching of an entire upper surface of the wafer substrate, the systemcomprising:

-   -   a process chamber;    -   a platen assembly disposed therein configured to receive a wafer        substrate,    -   an inlet for receiving process gas into the chamber;    -   means for generating a plasma;    -   a voltage generator which is configured to apply a radio        frequency voltage to the platen assembly, to bias the voltage of        the platen assembly;    -   a monitoring arrangement configured to monitor a voltage        difference between the platen assembly and the process chamber,        during the plasma etch process; and    -   a processor communicatively coupled with the monitoring        arrangement and the means for generating a plasma, which is        configured to attenuate or extinguish the plasma to prevent        further etching, once a threshold monitored voltage is reached.

In an embodiment, the monitoring arrangement is configured to output asignal, representative of the voltage difference between the platenassembly and the chamber, to the processor. The processor is configuredto determine an amount of deformation relative to the platen assembly independence of the signal output from the monitoring arrangement, andoutput a signal to the means for generating a plasma in dependence ofthe signal output from the monitoring arrangement.

In an embodiment, the means for generating a plasma comprises an RFgenerator which is arranged to inductively or capacitively couple RFpower into the chamber. The processor is communicatively coupled withthe RF generator, for controlling the coupling of RF power into thechamber.

The means for generating a plasma further comprises one or more antennaor coils disposed around the chamber which are electrically coupled withthe RF generator for generating a plasma in the chamber. Alternatively,or in addition thereto, the RF generator may be electrically coupled tothe platen assembly for generating plasma in the chamber.

The monitoring arrangement is preferably configured to monitor apeak-to-peak voltage difference between the platen assembly and thechamber. In a further embodiment, the monitoring arrangement isconfigured to monitor or further monitor a direct current (dc) voltagedifference between the platen assembly and the process chamber.

The system further comprises means for controlling a temperature of theplaten assembly.

According to a third aspect of the present invention, there is provideda system for monitoring deformation of a wafer substrate during a plasmaetching of an entire upper surface of the wafer substrate, the systembeing configured to implement the method according to the first aspect.

Whilst the invention has been described above, it extends to anyinventive combination of features set out above or in the followingdescription. Although illustrative embodiments of the invention aredescribed in detail herein with reference to the accompanying drawings,it is to be understood that the invention is not limited to theseprecise embodiments.

Furthermore, it is contemplated that a particular feature describedeither individually or as part of an embodiment can be combined withother individually described features, or parts of other embodiments,even if the other features and embodiments make no mention of theparticular feature. Thus, the invention extends to such specificcombinations not already described.

BRIEF DESCRIPTION OF THE DRAWINGS

The invention may be performed in various ways, and, by way of exampleonly, embodiments thereof will now be described with reference to theaccompanying drawings, in which:

FIG. 1 is a schematic illustration of a system according to anembodiment of the present invention for monitoring deformation of awafer substrate during a plasma etching of the wafer substrate;

FIG. 2 is a schematic illustration of the steps associated with a methodaccording to a first embodiment of the present invention for monitoringdeformation of a wafer substrate during a plasma etching of the wafersubstrate;

FIGS. 3(a) and 3(b) are a graphical representation of the variation inthe magnitude of the induced ac and dc voltage components in the platenassembly, during the plasma etching of a wafer substrate whichexperiences (a) minimal deformation and (b) noticeable deformation;

FIGS. 4(a) through 4(g) are graphical representations of the variationin the magnitude of the induced ac voltage component in the platenassembly, during the plasma etching of seven wafer substrates; and,

FIG. 5 is a schematic illustration of the steps associated with a methodaccording to a second embodiment of the present invention for monitoringdeformation of a wafer substrate during a plasma etching of the wafersubstrate.

DETAILED DESCRIPTION OF EMBODIMENTS

Referring to FIG. 1 of the drawings, there is illustrated a system 10according to an embodiment of the present invention for monitoringdeformation of a wafer substrate 11 (hereafter referred to as “wafer”),principally an electrically insulating wafer 11, such as a sapphire orglass wafer, during a plasma etching of the wafer 11. The system 10 isarranged to monitor for any warping and bowing of the wafer 11 duringthe etching process, in an endeavor to preempt any fracture or crackingof the wafer 11 or otherwise terminate the etching process once thedesired wafer configuration has been achieved.

The system 10 comprises a process chamber 12, within which the plasmaetching of the wafer 11 is performed. The process chamber 12 compriseschamber walls 12 a which may be formed of a metal, such as aluminium forexample, and which are typically electrically grounded. The system 10further comprises a platen assembly 13, which may also be formed of ametal, such as aluminium, disposed within the chamber 12, but iselectrically isolated from the chamber walls 12 a by conventional means,such as ceramic breaks 14.

The platen assembly 13 comprises a body 13 a having a support surface 13b for receiving the wafer 11. The wafer 11 is not mechanically clampedto the platen assembly 13 and this ensures that there are no regions ofthe wafer 11 which are covered by the clamp (not shown). In turn, thisensures that the entire upper surface 11 a of the wafer 11 is exposedand subjectable to a substantially similar rate of etching, whichassists in minimizing stress variations across the wafer surface. Thewafer 11 is thus simply placed on the support surface 13 b prior toinitiating an etch process.

The system 10 and in particular the chamber 12, further comprises a gasinlet 15 to which a source of process gas (not shown) can fluidly couplefor introducing the gas, which may comprise argon, chlorine or borontrichloride gas for example, into the chamber 12. The chamber 12 furthercomprises an outlet 16, via which the process gas and any by-products ofthe etching process can pass out from the chamber 12.

In an embodiment, the plasma is generated by applying a radio frequency(RF) voltage from an RF voltage generator 17, to one or more antenna 18,which are disposed around the chamber 12 and located adjacent arespective dielectric window section 12 b formed in the chamber walls 12a. The one or more antenna 18 may comprise a substantially planar spiralconfiguration, a helical coil configuration or a toroidal configuration,for example, and as with standard practice, impedance matching of the RFsignal from the generator 17 with the antenna 18 is carried out tominimise reflection of electrical power from the antenna 18. Theantennas 18 are placed around the chamber 12 and the electrical power isinductively coupled into the chamber 12, through the dielectric windowsections 12 b.

A plasma is generated in a region 19 of the chamber 12 which is disposedabove the wafer 11 so that the wafer 11 becomes exposed to the plasma.The gas is drawn through the chamber 12 via a pump, such as a turbomolecular pump 20, which may be disposed in the outlet 16 of the chamber12 or downstream thereof, and the inlet 15 and outlet 16 of the chamber12 are disposed on opposite sides of the plasma region 19 so that theprocess gas is required to pass through the chamber 12, via the region19 and over the wafer 11, in passing to the outlet 16.

In an embodiment, the platen assembly 13 may further comprise a heatmanagement device 21 comprising a ducting arrangement 21 a which extendsthrough the platen assembly 13 for communicating a fluid therethrough.The fluid (not shown) is arranged to exchange heat with the platenassembly 13 and regulate the temperature of the platen assembly 13, andthus control the temperature of the wafer 11.

The system 10 further comprises a monitoring arrangement 22 which isarranged to monitor a voltage difference between the platen assembly 13and the chamber walls 12 a, and a processor 23 for controlling the RFpower coupled into the chamber 12. The monitoring arrangement 22 maycomprise a voltage sensing device 24, such as a voltmeter, which isconfigured to monitor a peak-to-peak voltage difference between theplaten assembly 13 and the chamber walls 12 a, and also a direct current(dc) voltage difference between the platen assembly 13 and the chamberwalls 12 a. The voltage sensing device 24 is communicatively coupled tothe processor 23 and is arranged to output a signal representative ofthe peak-to-peak voltage difference and the dc voltage difference to theprocessor 23.

The system may further comprise a voltage generator 25, for applying aradio frequency bias voltage, to the platen assembly 13. The provisionof a negative bias voltage to the platen assembly 13 for example, canhelp to control positively charged ion bombardment of the surface of thewafer 11.

Referring to FIG. 2 of the drawings, there is illustrated the stepsassociated with a method 100 according to a first embodiment of thepresent invention for monitoring and controlling deformation of a wafersubstrate 11, principally an electrically insulating wafer 11, during aplasma etching of the wafer 11. The wafer 11 is first placed upon theplaten assembly 13 within the chamber 12 at step 101, and the chamber 12is subsequently evacuated prior to passing a process gas through thechamber 12, at step 102. The process gas is drawn into the chamber 12from a source thereof (not shown) by the pump 20, and the pressurewithin the chamber 12 is maintained at approximately 5-25 mT by apressure controller (not shown). The gas is drawn from the inlet 15,through the plasma region 19 and over the wafer 11, prior to exiting thechamber 12 via the outlet 16.

Once the chamber 12 has been suitably evacuated and/or purged with theprocess gas, an RF potential, typically operating between 2 MHz and13.56 MHz, is applied to the antenna 18 at step 103 a to inductivelycouple electrical power into the low pressure process gas, and thusinitiate a plasma and commence the etching of the wafer substrate 11. Abias voltage is also applied to the platen assembly 13 through the useof the voltage generator 25, typically operating between 380 kHz and13.56 MHz, at step 103 b.

The Vpp and Vdc values are found to be dependent on the area of thesupport surface 13 b which is exposed to the plasma, namely the area ofthe support surface 13 b which is not in contact with the wafer 11. Anydeformation or reconfiguration of the wafer 11 resulting from theetching process, such as any warping, bowing or even flattening of thewafer 11 particularly along a periphery of the wafer 11, will result ina change in the area of the support surface 13 b which is covered by thewafer 11. This manifests as a change in the area of the support surface13 b which is exposed to the plasma and thus a change in Vpp and Vdc.

Vpp and Vdc are monitored by the monitoring arrangement 22 at step 104.In an embodiment where the method is used to prevent wafer fracture orbreakage, a signal representative of the monitored values for Vpp andVdc components at the start of the etch process is recorded and used topreset a threshold value for the Vpp and Vdc voltage components, at step105, for triggering an attenuation of the plasma or for causing theplasma to become extinguished. The threshold value for the Vpp componentis typically set at 10-20% above the initial Vpp value, whereas thethreshold value of the Vdc component may be set at typically 50-100%above the initial Vdc component.

The signal representative of the monitored values for Vpp and Vdccomponents is periodically communicated to the processor 23 during theetching process at step 106, and in the event that the signal indicatesthat the Vpp or Vdc voltage component rises above the respectivethreshold value, then the processor 23 is configured to communicate asignal to the RF voltage signal generator 17 to attenuate or extinguishthe plasma at step 107, and thus prevent further etching.

Referring to FIG. 3 of the drawings, there is illustrated arepresentative variation of the magnitude of the Vpp voltage componentand the magnitude of the Vdc voltage component in the platen assembly13, for two 150 mm sapphire wafers as a function of the etch processingtime (seconds). Table 1 below summarises the process conditions foretching a sapphire substrate at a rate of >150 nm/min using a SPTSTechnologies Advanced Plamsa System (APS) plasma etch module.

In FIG. 3a of the drawings we can see Vpp and Vdc values as a functionof etch time for normal operation. Vpp is seen to be stable atapproximately 1550V, and Vdc is seen to be stable at <10V during theetching process. However, in FIG. 3b of the drawings where undesirablewafer deformation occurs, Vpp is seen to increase to >1850V and Vdc isseen to increase to >100V. This increase in voltage difference betweenthe platen assembly 13 and the chamber walls 12 a, for both Vpp and Vdcis indicative of wafer deformation, since as the wafer 11 bows andwarps, further regions of the support surface 13 b become exposed to theplasma. Accordingly, it is anticipated that further etching of the wafer11, will likely result in the wafer breaking due to the excessivedeformation. However, as there is some degree of variation in thegrinding/polishing processes of the wafer 11, there is variability inthe amount of deformation, namely bow and warpage that the wafer 11 cantolerate before breaking.

TABLE 1 Process Chemistry Pressure RF Source RF Bias TemperatureAr/Cl₂/BCl₃ (160 5-25 mT 800-1000 W 300-500 W 20° C. sccm total flow)

Referring to FIG. 4 of the drawings there is illustrated a graphicalrepresentation of the variation in the magnitude of Vpp in the platenassembly 13 for seven sapphire wafers, each comprising a diameter of 150mm. The wafers were separately etched using the above described systemwith the intention of removing approximately 1-2 μm during a front side(FS) etch and approximately 3 μm from a back side (BS) etch. A thresholdvalue of 1770V for Vpp was set during the etching of wafers 2-7, and assuch the etching process was terminated once Vpp reached this thresholdvalue. However, no threshold value for Vpp was set for wafer 1, so thatthe etch process would continue regardless of the Vpp value. Table 2below, summarises the results of the etching process for each wafer.

Upon referring to FIG. 4 of the drawings, and initially FIG. 4a whichrelates to wafer 1, it is evident that Vpp increased from approximately1600V at the start of the etching process to approximately 1884V at aprocess time of approximately 870 s. This increase is representative ofthe warp and bow of the wafer and is consistent with the theory that thewafer forms a concave structure during the etch process, and thisdeformation exposes more of the support surface 13 b to the plasma.However, the etching process was not terminated at 870 s owing to thenon-use of a threshold value for Vpp, and as such Vpp is seen to dropsuddenly from 1884V to the Vpp value at the start of the etchingprocess, namely 1600V. This discontinuous change in Vpp ischaracteristic of the wafer breaking, since as the wafer breaks itrelaxes from the deformed, concave arrangement to the initial flatconfiguration in which the wafer 11 which covers the support surface 13b.

TABLE 2 Pre bow Pre warp Post Bow Post warp FS etch BS etch Wafer (μm)(μm) (μm) (μm) (μm) (μm) Intervention 1 −5 25 Not Not Not Not Wafermeasured measured measured measured cracked 2 N/M N/M 79.2 93 1.12 2.79Intervention 3 −1.458 10.013 42.6 89.2 1.12 3.20 Full etch 4 −2.57911.486 55.7 61.0 1.12 2.73 Intervention 5 −76.804 86.94 57.3 66.2 1.122.20 intervention 6 −8.903 11.759 41.5 45 1.12 3.20 Full etch 7 −63.0693.627 22.7 31 2.08 3.20 Full etch

Upon referring to FIGS. 4c and 4d of the drawings and table 2, wafers 3& 4 show similar pre-etch bow and warp values, however, it is evidentthat wafers 3 and 4 display different Vpp traces as a function of time(probably due to different stress distribution between the front sideand back side of the wafers causing different deformations to emerge onthe two wafers). Due to the rapid increase in Vpp for wafer 4 to 1770Vat 1134 s, the process was stopped before completing the 3 μm back sideetch to reduce the likelihood of wafer breakage. Wafers 2 and 5 alsorequired the process to be curtailed due to Vpp values rising beyond thepreset threshold value for Vpp, as illustrated in FIGS. 4b and 4e of thedrawings, respectively. However, upon referring to FIGS. 4c, 4f and 4gof the drawings, it is evident that the Vpp value for wafers 3, 6 and 7respectively, did not rise above the preset threshold and as such, therewas no requirement to terminate the etch process.

Referring to FIG. 5 of the drawings, there is illustrated a method 200according to a second embodiment of the present invention for monitoringand controlling deformation of a wafer substrate 11, principally anelectrically insulating wafer 11, during a plasma etching of the wafer11. The method 200 of the second is arranged to terminate an etchprocess involving an initially warped or bowed wafer 11, for example. Awafer 11 may comprise a warped or bowed initial configuration due to thepresence of an undesirable coating or layer of material (not shown)disposed thereon which creates a stress variation between a front andrear surface of the wafer 11. In this situation, as the etching processevolves the coating or layer will become removed which will result inthe wafer 11 relaxing to a flattened state in which it covers thesupport surface 13 b of the platen assembly 13.

The method 200 of the second embodiment is substantially the same as themethod of the first embodiment and so like steps have been referencedwith the same numeral, but increased by 100. In this embodiment, Vpp andVdc are monitored by the monitoring arrangement 22 at step 204 so thatthe etching process can be terminated once the desired reconfigurationor deformation (namely a flat configuration) of the wafer 11 has beenachieved.

A signal representative of the Vpp and Vdc components of a flat waferdisposed upon the support surface 13 b is used to preset a thresholdvalue for the Vpp and Vdc voltage components at step 205, for triggeringan attenuation of the plasma or for causing the plasma to becomeextinguished. The signal representative of the monitored values for Vppand Vdc components is periodically communicated to the processor 23during the etching process at step 206, and once the signal indicatesthat the Vpp or Vdc voltage component has reduced to the respectivethreshold value (which is representative of a flat wafer), then theprocessor 23 is configured to communicate a signal to the RF voltagesignal generator 17 to attenuate or extinguish the plasma at step 107,and thus prevent further etching.

From the foregoing therefore, it is evident that the above describedmethod and system provide for an indication of the deformation orreconfiguration of a wafer during a plasma etching process.

What is claimed is:
 1. A method of monitoring and controllingdeformation of a wafer substrate during plasma etching of the wafersubstrate, the method comprising: disposing a wafer substrate on aplaten assembly within a process chamber so that an entire upper surfaceof the wafer is exposed; passing a process gas into the process chamber;applying a radio frequency bias voltage to the platen assembly;generating a plasma within the process chamber; monitoring a voltagedifference between the platen assembly and the process chamber, duringthe etch process; attenuating or extinguishing the plasma to preventfurther etching once a threshold monitored voltage is reached.
 2. Amethod according to claim 1, the deformation is monitored relative tothe platen assembly.
 3. A method according to claim 2, wherein an amountof relative deformation is determined by monitoring the voltagedifference between the platen assembly and the chamber, as the gasetches the wafer substrate.
 4. A method according to claim 1, whereinthe substrate is electrically insulating.
 5. A method according to claim1, wherein the plasma is generated by inductively or capacitivelycoupling radio frequency (RF) power into the process chamber.
 6. Amethod according to claim 5, further comprising inductively coupling RFpower into the chamber by applying an RF potential to one or moreantenna disposed around the chamber.
 7. A method according to claim 1,comprising a monitoring a peak-to-peak voltage difference (Vpp) betweenthe platen assembly and the chamber.
 8. A method according to claim 1,comprising or further comprising monitoring a direct current voltagedifference (Vdc) between the platen assembly and the chamber.
 9. Amethod according to claim 7, further comprising attenuating orextinguishing the plasma, once the Vpp between the platen assembly andthe chamber exceeds 10% of Vpp at the start of the etching process. 10.A method according to claim 7, further comprising attenuating orextinguishing the plasma, once the Vpp between the platen assembly andthe chamber exceeds 20% of the Vpp at the start of the etching process.11. A method according to claim 8, further comprising attenuating orextinguishing the plasma, once the Vdc between the platen assembly andthe chamber exceeds 50% of the Vdc at the start of the etching process.12. A method according to claim 8, further comprising attenuating orextinguishing the plasma, once the Vdc between the platen assembly andthe chamber exceeds 100% of the Vdc at the start of the etching process.13. A method according to claim 7, further comprising attenuating orextinguishing the plasma once the monitored peak-to-peak voltagedifference reduces to a value which is characteristic of a peak-to-peakvoltage difference of a wafer which extends in a substantially flatorientation upon the platen assembly.
 14. A method according to claim 8,further comprising attenuating or extinguishing the plasma once themonitored direct current voltage difference reduces to a value which ischaracteristic of a direct current voltage difference of a wafer whichextends in a substantially flat orientation upon the platen assembly.15. A method according to claim 1, further comprising controlling atemperature of the platen assembly, to regulate a temperature of thewafer substrate.
 16. A system for monitoring deformation of a wafersubstrate during a plasma etching of an entire upper surface of thewafer substrate, the system comprising: a process chamber; a platenassembly disposed therein configured to receive a wafer substrate, aninlet for receiving process gas into the chamber; means for generating aplasma; a voltage generator which is configured to apply a radiofrequency voltage to the platen assembly, to bias the voltage of theplaten assembly; a monitoring arrangement configured to monitor avoltage difference between the platen assembly and the process chamber,during the plasma etch process; and, a processor communicatively coupledwith the monitoring arrangement and the means for generating a plasma,which is configured to attenuate or extinguish the plasma to preventfurther etching, once a threshold monitored voltage is reached.
 17. Asystem for monitoring deformation of a wafer substrate during a plasmaetching of an entire upper surface of the wafer substrate, the systembeing configured to implement the method of claim 1.